ASAP Defense Parts is a streamlined procurement platform for those seeking in-demand NSN parts, military and defense parts, aerospace parts, and other comparable items. We appreciate your interest in part number TS268EU, a Voron Electronics Corp product that is listed alongside the description “Test Set Semiconduc” and the NSN 6625009236534. You are always welcome to request quotes for part number TS268EU by filling out and submitting the RFQ form below, and we promise swift responses with customized solutions provided in 15 minutes or less from the review of a completed form.
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For your convenience, we list items like Voron Electronics Corp part number TS268EU with all relevant designations. For example, while part number TS268EU belongs to NSN 6625-00-923-6534, it is also categorized under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments, a commodity classification designation that organizes similar products together. Moreover, in contrast to other websites that often require one to choose between quality, pricing, and timely fulfillment, we routinely utilize our market expertise and purchasing power to present optimal solutions that cater to the unique specifications of each customer. With all of this in mind, begin the procurement process for part number TS268EU from CAGE Code 94518 on our website, and see why so many customers steadily depend on us for their needs.
MRC | Criteria | Characteristic |
---|---|---|
ABRY | Length | 8.187 INCHES NOMINAL |
MRC | Decoded Requirement | Clear Text Reply |
HGTH | Height | 3.625 INCHES NOMINAL |
AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
ABGL | Width | 6.000 INCHES NOMINAL |
AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
ALSF | Internal Battery Accommodation | INCLUDED |
ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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