ASAP Defense Parts is a streamlined procurement platform for those seeking in-demand NSN parts, military and defense parts, aerospace parts, and other comparable items. We appreciate your interest in part number 116475, a Rugged Information Technology product that is listed alongside the description “Microcircuit Memory” and the NSN 5962014490676. You are always welcome to request quotes for part number 116475 by filling out and submitting the RFQ form below, and we promise swift responses with customized solutions provided in 15 minutes or less from the review of a completed form.
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For your convenience, we list items like Rugged Information Technology part number 116475 with all relevant designations. For example, while part number 116475 belongs to NSN 5962-01-449-0676, it is also categorized under FSC 5962 Microcircuits Electronic, a commodity classification designation that organizes similar products together. Moreover, in contrast to other websites that often require one to choose between quality, pricing, and timely fulfillment, we routinely utilize our market expertise and purchasing power to present optimal solutions that cater to the unique specifications of each customer. With all of this in mind, begin the procurement process for part number 116475 from CAGE Code 09BZ2 on our website, and see why so many customers steadily depend on us for their needs.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-449-0676 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 014490676 | 0 | N | D | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | D | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 8200902JA | 5 | 1 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CBBL | Features Provided | BIPOLAR AND BURN IN AND 3-STATE OUTPUT AND MONOLITHIC |
| AEHX | Maximum Power Dissipation Rating | 1.04 WATTS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQSJ | Inclosure Material | CERAMIC |
| MRC | Decoded Requirement | Clear Text Reply |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TTQY | Terminal Type And Quantity | 24 PRINTED CIRCUIT |
| CWSG | Terminal Surface Treatment | SOLDER |
| AGAV | End Item Identification | TERMINAL, RADIO COMMUNICATIONS SETS (MILSTAR) AN/FRC-181 (V) AND AN/ARC-208 (V) |
| CZEQ | Time Rating Per Chacteristic | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL INPUT |
| CZER | Memory Device Type | PAL |
| CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
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